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Journal of Electronic Testing

Theory and Applications
ISSN: 0923-8174 (print version)
ISSN: 1573-0727 (electronic version)
Journal no. 10836
Springer US

Online version available



Description | Editorial Board | Most viewed articles



Most viewed articles

Most viewed articles are the full-text articles from this journal that have been accessed most frequently within the last 90 days. The collection of most viewed articles below is updated weekly.

1. An On-Chip Spectrum Analyzer for Analog Built-In Testing
Méndez-Rivera, M.G., Valdes-Garcia, A.
Published Print: June 2005



2. Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults
Cota, É., Lima, F.
Published Print: April 2001


3. Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division
Yamaguchi, T.J., Ishida, M.
Published Print: April 2003


4. Classification of Defective Analog Integrated Circuits Using Artificial Neural Networks
Stopjaková, V., Malošek, P.
Published Print: February 2004


5. Test-Per-Clock Logic BIST with Semi-Deterministic Test Patterns and Zero-Aliasing Compactor
Novák, O., Plíva, Z.
Published Print: February 2004





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