|
|
Journal of
Electronic Testing
Theory
and Applications ISSN: 0923-8174 (print version) ISSN: 1573-0727
(electronic version) Journal no. 10836 Springer
US
Online version available
|
Most viewed articles
Most viewed articles are the full-text
articles from this journal that have been accessed most frequently within
the last 90 days. The collection of most viewed articles below is updated
weekly.
1. An On-Chip Spectrum Analyzer for Analog Built-In
Testing
Méndez-Rivera, M.G., Valdes-Garcia, A. Published
Print: June 2005
|
|
2. Synthesis of an 8051-Like Micro-Controller Tolerant
to Transient Faults Cota, É., Lima, F.
Published
Print: April 2001
|
|
3. Timing Jitter Measurement of Intrinsic Random
Jitter and Sinusoidal Jitter Using Frequency Division
Yamaguchi, T.J.,
Ishida, M. Published Print: April 2003
|
|
4. Classification of Defective Analog Integrated
Circuits Using Artificial Neural Networks Stopjaková, V.,
Malošek, P. Published Print: February 2004
|
|
5. Test-Per-Clock Logic BIST with Semi-Deterministic
Test Patterns and Zero-Aliasing Compactor Novák, O., Plíva, Z.
Published
Print: February 2004
|
|
|
|
|
Print
version
Recommend
to others
E-content
For authors and editors
Aims
and scope
Instructions for authors (pdf, 257 Kb)
Instructions
for Authors
Copyright transfer statement (pdf, 39 Kb)
Additional information
Shipping
dates
Order
this journal
Article
Reprints
Bulk
Orders
Other contacts
Production
Customer
Service
Advertising
Related subjects
Circuits
& Systems
Electronics
& Electrical Engineering
Information
Systems
|
|