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Journal of
Electronic Testing
Theory
and Applications
ISSN: 0923-8174 (print version)
ISSN: 1573-0727
(electronic version)
Journal no. 10836
Springer
US
Online version available
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Most viewed articles
Most viewed articles are the full-text
articles from this journal that have been accessed most frequently within
the last 90 days. The collection of most viewed articles below is updated
weekly.
1. An On-Chip Spectrum Analyzer for Analog Built-In
Testing
Méndez-Rivera, M.G., Valdes-Garcia, A.
Published
Print: June 2005
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2. Synthesis of an 8051-Like Micro-Controller Tolerant
to Transient Faults
Cota, É., Lima, F.
Published
Print: April 2001
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3. Timing Jitter Measurement of Intrinsic Random
Jitter and Sinusoidal Jitter Using Frequency Division
Yamaguchi, T.J.,
Ishida, M.
Published Print: April 2003
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4. Classification of Defective Analog Integrated
Circuits Using Artificial Neural Networks
Stopjaková, V.,
Malošek, P.
Published Print: February 2004
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5. Test-Per-Clock Logic BIST with Semi-Deterministic
Test Patterns and Zero-Aliasing Compactor
Novák, O., Plíva, Z.
Published
Print: February 2004
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